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Fully automatic wafer measurement white light interference

Fully automatic white light interferometry system

Can measure 8-inch and 12-inch wafers

LOADER can also be planned

Both FOSB and FOUP can be applied

 

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Fully automatic wafer white light interference measurement

Measurement points can be set for fully automatic measurement

Micro structure height measurement, plane measurement, roughness measurement, film thickness measurement

Export report and upload after measurement

LOADER can be planned according to the type of wafer box

Both front and back examination and microscopic examination are available

Welcome to call us for planning

 

 

With a positive, careful, and honest attitude, we provide professional technology to plan for customers' needs and provide tailor-made equipment. In addition to providing customized testing equipment, we also have complete product equipment for client testing.

Taipei

  • (02) 22981517
  • 1st Floor, No. 1-5, Lane 211, Huacheng Road, Xinzhuang District, New Taipei City

Taichung

Hsinchu

  • (03) 6683412
  • No. 216, Section 2, Liujia 5th Road, Zhubei City, Hsinchu County

Kaohsiung

  • (07) 3316764
  • 8th Floor, No. 92, Minquan 2nd Road, Qianzhen District, Kaohsiung City
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Fully automatic wafer measurement white light interference inquiry