Can be expanded to metallographic or tool microscopes
Optional stage and anti-vibration table
A single lens can measure 3D contours of shapes
Quite an affordable option
product description
Features
product specification
video introduction
1. Available on Olympus, Nikon, Leica and other metallographic/tool microscopes.
White light interference sensing elements are installed on the lens and C-mount. It is upgraded to a 3D white light interference measuring instrument.
2.Light source: high brightness photoelectric tube 505nm
3.CCD analysis: Standard: 780×582 pixels, 48fps (Wire Fire)/Optional: 1280×1024 pixels, 169 fps (USB3)
4.Z-axis measurement range: 100, 250, 400um optional
5.XY measurement area: Depends on the lens
6.Z-axis measurement accuracy: Depends on the installation of interference objective lens and measurement range
5X objective lens: 1nm /10X objective lens: 1nm/ 20X objective lens: 0.3nm/ 50X objective lens: 0.3nm/ 100X objective lens: 0.1nm (the above is 400um)
7.Software functions: microstructure profile, surface roughness, coating thickness
2D and 3D dimensions and image display, report output function.
8. Optional: XY electric platform, puzzle software stitching function
9. Optional: XYZ electric platform, fully automatic measurement function
10. Optional: Active anti-shock table (pictured)
